Substrates with a good surface figure and surface quality are required to produce high-quality laser optics. The surface roughness should, therefore, be inspected for laser optics.
Such measurements are performed at Laser Components with a white-light interferometer. White-light interferometry is a non-contact optical measurement method which uses the interference of broadband light to measure the three-dimensional structure of a surface. The measurement accuracy is <0.1 nm for vertical resolution.
All of the lenses produced in house, similar to the substrates produced externally, can be tested using this new technology. This extra quality control means that our customers can be sure that they always receive high-quality optics.
For applications that require “superpolished” optics – or if otherwise required – the surface roughness can be documented as necessary.
A typical measurement is shown on the picture.
In the top part of the figure, the two and three-dimensional vertical profile of the surface is shown. The results of the analysis are summarized subsequently in a table. The PV value represents the maximum value of the difference in height. The RMS value represents the microroughness. The average vertical profile can also be seen in the center.
The above-referenced measurements are performed by us on a random basis for all substrates. In special applications, such measurements are always performed and can be documented on customer request.
By measuring the microroughness of the substrate’s surfaces, we are able to ensure that the quality of the optics used by us is consistently high.
We are available to field any inquiries regarding this subject. We look forward to receiving your feedback with any comments and requests concerning this matter.
